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NEX LS

PROCESS ENERGY DISPERSIVE (EDXRF) ANALYZER
Real-time, on-line, scanning process coating thickness/composition

TechniqueX-ray fluorescence (XRF)
BenefitReal time, on-line elemental analysis of Al through U for coating thickness/composition
TechnologyProcess energy dispersive XRF
Core attributes50 kV, 4 W X-ray tube, SDD detector, scanning head

Saite uz ražotāja mājaslapu: NEX LS

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